Wednesday, 16 November 2016

GATE Instrumentation Engineering Exam Pattern and Syllabus 2017

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GATE Instrumentation Engineering Exam Pattern and Syllabus 2017

Instrumentation Engineering is one out of 23 papers in GATE exam 2017 syllabus. Aspirants with Instrumentation Engineering background can opt for this paper during Gate exam application procedure.

Exam Pattern

1. Questions will be in two different types:
(i) Multiple Choice Questions (MCQ) 
(ii) Numerical Answer Questions.

2. In all the papers, there will be a total of 65 questions carrying 100 marks, out of which 10 questions carrying a total of 15 marks are in General Aptitude (GA).

3. In the paper, the Engineering Mathematics will carry around 15% of the total marks, the General Aptitude section will carry 15% of the total marks and the remaining 70% percentage of the total marks is devoted to the subject of the paper.

4. The questions in a paper may be designed to test the following abilities : Recall, Comprehension, Application and Analysis & Synthesis.

Exam Syllabus

Engineering Mathematics

Linear Algebra:
Matrix algebra, Systems of linear equations, Eigen values and Eigen vectors.

Calculus: 
Functions of single variable, Limit, continuity and differentiability, Mean value theorems, Evaluation of definite and improper integrals, Partial derivatives, Total derivative, Maxima and minima, Gradient, Divergence and Curl, Vector identities, Directional derivatives, Line, Surface and Volume integrals, Stokes, Gauss and Green’s theorems.

Differential equations: 
First order equations (linear and nonlinear), Higher order linear differential equations with constant coefficients, Cauchy’s and Euler’s equations, Initial and boundary value problems, Laplace transforms, Solutions of one dimensional heat and wave equations and Laplace equation.

Complex variables: 
Analytic functions, Cauchy’s integral theorem, Taylor and Laurent series.

Probability and Statistics: 
Definitions of probability and sampling theorems, Conditional probability, Mean, median, mode and standard deviation, Random variables, Poisson, Normal and Binomial distributions.

Numerical Methods: 
Numerical solutions of linear and non-linear algebraic equations Integration by trapezoidal and Simpson’s rule, single and multi-step methods for differential equations.

Instrumentation Engineering

Voltage and current sources:
independent, dependent, ideal and practical; v-irelationships of resistor, inductor, mutual inductor and capacitor; transient analysis of RLC circuits with dc excitation. Kirchoff’s laws, mesh and nodal analysis, superposition, Thevenin, Norton, maximum power transfer and reciprocity theorems.Peak-, average- and rmsvalues of ac quantities; apparent-, active- and reactive powers;phasor analysis, impedance and admittance; series and parallel resonance, locus diagrams, realization of basic filters with R, L and C elements.One-port and two-port networks, driving point impedance and admittance, open-, andshort circuit parameters

Transducers, Mechanical Measurement and Industrial Instrumentation:
Resistive, Capacitive, Inductive and piezoelectric transducers and their signal conditioning. Measurement of displacement, velocity and acceleration (translational and rotational), force, torque, vibration and shock. Measurement of pressure, flow, temperature and liquid level. Measurement of pH, conductivity, viscosity and humidity.

Analog Electronics: 
Characteristics of diode, BJT, JFET and MOSFET. Diode circuits. Transistors at low and high frequencies, Amplifiers, single and multi-stage. Feedback amplifiers.Operational amplifiers, characteristics and circuit configurations. Instrumentation amplifier. Precision rectifier. V-to-I and I-to-V converter. Op-Amp based active filters. Oscillators and signal generators.

Digital Electronics: 
Combinational logic circuits, minimization of Boolean functions. IC families, TTL, MOS and CMOS. Arithmetic circuits. Comparators, Schmitt trigger, timers and mono-stable multi-vibrator. Sequential circuits, flip-flops, counters, shift registers. Multiplexer, S/H circuit.Analog-to-Digital and Digital-to-Analog converters.Basics of number system. Microprocessor applications, memory and input-output interfacing. Microcontrollers.

Signals, Systems and Communications: 
Periodic and aperiodic signals. Impulse response, transfer function and frequency response of first and second order systems. Convolution, correlation and characteristics of linear time invariant systems.Discrete time system, impulse and frequency response. Pulse transfer function. IIR and FIR filters. Amplitude and frequency modulation and demodulation. Sampling theorem, pulse code modulation. Frequency and time division multiplexing. Amplitude shift keying, frequency shift keying and pulse shift keying for digital modulation.

Electrical and Electronic Measurements: 
Bridges and potentiometers, measurement of R,L and C. Measurements of voltage, current, power, power factor and energy. A.C & D.C current probes. Extension of instrument ranges. Q-meter and waveform analyzer. Digital voltmeter and multi-meter. Time, phase and frequency measurements. Cathode ray oscilloscope. Serial and parallel communication. Shielding and grounding.

Control Systems and Process Control: 
Feedback principles. Signal flow graphs. Transient Response, steady-state-errors. Routh and Nyquist criteria. Bode plot, root loci. Time delay systems.Phase and gain margin. State space representation of systems.Mechanical, hydraulic and pneumatic system components. Synchro pair, servo and step motors. On-off, cascade, P, P-I, P-I-D, feed forward and derivative controller, Fuzzy controllers.

Analytical, Optical and Biomedical Instrumentation: 
Mass spectrometry. UV, visible and IR spectrometry. X-ray and nuclear radiation measurements. Optical sources and detectors, LED, laser, Photo-diode, photo-resistor and their characteristics. Interferometers, applications in metrology. Basics of fiber optics. Biomedical instruments, EEG, ECG and EMG. Clinical measurements. Ultrasonic transducers and Ultrasonography. Principles of Computer Assisted Tomography.


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